"Field testing for cosmic ray soft errors in semiconductor memories."

Timothy J. O'Gorman et al. (1996)

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DOI: 10.1147/RD.401.0041

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/ibmrd/OGormanRTZMMCW96
Timothy J. O'Gorman, John M. Ross, Allen H. Taber, James F. Ziegler, Hans P. Muhlfeld, Charles J. Montrose, Huntington W. Curtis, James L. Walsh:
Field testing for cosmic ray soft errors in semiconductor memories. IBM J. Res. Dev. 40(1): 41-50 (1996)

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