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ORCIDHisanaga Fujiwara
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2000 – 2009
- 2009
[c12]Hisanaga Fujiwara:
Intrinsic Color Acquisition By Active Color Lighting. MVA 2009: 459-462- 2007
- [c11]Hisanaga Fujiwara, Zhong Zhang, Tetsuo Miyake, Akio Miwa:
Shift-Variant Restoration of Defocused Images Using Shift-Invariant Wavelet Transform. MVA 2007: 94-98 - 2006
- [j3]Zhong Zhang, Hiroshi Toda, Hisanaga Fujiwara, Fuji Ren:
Translation Invariant Ri-spline Wavelet and its Application on De-noising. Int. J. Inf. Technol. Decis. Mak. 5(2): 353-378 (2006) - [c10]Zhong Zhang, Shiqing Ren, Tetsuo Miyake, Hisanaga Fujiwara, Takashi Imamura:
Reducing Specular Reflection Components of Metallic Surfaces Using Photometric Linearization. ICICIC (1) 2006: 121-125 - 2004
- [c9]Zhong Zhang, Hisanaga Fujiwara, Hiroshi Toda, Hiroaki Kawabata:
A new complex wavelet transform by using RI-spline wavelet. ICASSP (2) 2004: 937-940 - [c8]Zhong Zhang, Hiroaki Kawabata, Hisanaga Fujiwara, Fuji Ren:
Image processing using 2-D translation invariant RI-spline wavelet. SMC (3) 2004: 2971-2976 - [c7]Zhong Zhang, Hisanaga Fujiwara, Fuji Ren:
Signal processing using translation invariant RI-spline wavelet. SMC (4) 2004: 3267-3272 - 2003
- [c6]Hisanaga Fujiwara, Zhong Zhang, Hiroshi Toda, Hiroaki Kawabata:
Textile surface inspection by using translation invariant wavelet transform. CIRA 2003: 1427-1432 - 2001
- [c5]Hisanaga Fujiwara, Zhong Zhang, Koichi Hashimoto:
Toward Automated Inspection of Textile Surfaces: Removing the Textural Information by Using Wavelet Shrinkage. ICRA 2001: 3529-3534 - 2000
- [c4]Hisanaga Fujiwara, Zhong Zhang:
Removing the Intensity Variations Caused by Textures on Textile Surfaces Using Wavelet Shrinkage. MVA 2000: 55-58
1990 – 1999
- 1999
- [c3]Hisanaga Fujiwara, Zhong Zhang:
Estimating Vanishing Points Using Visual Spatial Frequencies of Textures on Planar Surfaces. ICIP (4) 1999: 425-429 - 1998
- [j2]Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama:
Edge and Depth from Focus. Int. J. Comput. Vis. 26(2): 153-163 (1998) - [j1]Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama:
Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model. IEEE Trans. Pattern Anal. Mach. Intell. 20(2): 155-167 (1998) - 1996
- [c2]Hisanaga Fujiwara:
Passive range sensor using multi-focus images. IROS 1996: 104-111 - 1995
- [c1]Naoki Asada, Hisanaga Fujiwara, Takashi Matsuyama:
Seeing Behind the Scene: Analysis of Photometric Properties of Occluding Edges by the Reversed Projection Blurring Model. ICCV 1995: 150-155
Coauthor Index
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