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ORCIDMartijn F. Snoeij
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2010 – 2019
- 2018
[c11]Martijn F. Snoeij:
A 36V 48MHz JFET-Input Bipolar Operational Amplifier with 150µV Maximum Offset and Overload Supply Current Control. ESSCIRC 2018: 290-293- 2016
- [j6]Martijn F. Snoeij, Viola Schaffer, Sudarshan Udayashankar, Mikhail V. Ivanov:
Integrated Fluxgate Magnetometer for Use in Isolated Current Sensing. IEEE J. Solid State Circuits 51(7): 1684-1694 (2016) - 2015
- [c10]Martijn F. Snoeij, Viola Schaffer, Sudarshan Udayashankar, Mikhail V. Ivanov:
An integrated fluxgate magnetometer for use in closed-loop/open-loop isolated current sensing. ESSCIRC 2015: 263-266 - 2011
- [c9]Shagun Bajoria, Martijn F. Snoeij, Viola Schaffer, Mikhail V. Ivanov, Sijia Wang, Kofi A. A. Makinwa:
A 36V voltage-to-current converter with dynamic element matching and auto-calibration for AC ripple reduction. ESSCIRC 2011: 319-322 - [c8]Martijn F. Snoeij, Mikhail V. Ivanov:
A 36V JFET-input bipolar operational amplifier with 1μV/°C maximum offset drift and -126dB total harmonic distortion. ISSCC 2011: 248-250
2000 – 2009
- 2009
- [j5]Viola Schaffer, Martijn F. Snoeij, Mikhail V. Ivanov, Dimitar Trifonov:
A 36 V Programmable Instrumentation Amplifier With Sub-20µV Offset and a CMRR in Excess of 120 dB at All Gain Settings. IEEE J. Solid State Circuits 44(7): 2036-2046 (2009) - 2008
- [c7]Viola Schaffer, Martijn F. Snoeij, Mikhail V. Ivanov:
A 36V precision programmable gain amplifier with CMRR exceeding 120dB in all gains. ESSCIRC 2008: 310-313 - [c6]Xinyang Wang, Martijn F. Snoeij, Padmakumar R. Rao, Adri Mierop, Albert J. P. Theuwissen:
A CMOS Image Sensor with a Buried-Channel Source Follower. ISSCC 2008: 62-63 - 2007
- [j4]Arnoud P. van der Wel, Eric A. M. Klumperink, Jay S. Kolhatkar, Eric Hoekstra, Martijn F. Snoeij, Cora Salm
, Hans Wallinga, Bram Nauta:
Low-Frequency Noise Phenomena in Switched MOSFETs. IEEE J. Solid State Circuits 42(3): 540-550 (2007) - [j3]Martijn F. Snoeij, Albert J. P. Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
Multiple-Ramp Column-Parallel ADC Architectures for CMOS Image Sensors. IEEE J. Solid State Circuits 42(12): 2968-2977 (2007) - [c5]Martijn F. Snoeij, P. Donegan, Albert J. P. Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
A CMOS Image Sensor with a Column-Level Multiple-Ramp Single-Slope ADC. ISSCC 2007: 506-618 - 2006
- [j2]Kofi A. A. Makinwa, Martijn F. Snoeij:
A CMOS Temperature-to-Frequency Converter With an Inaccuracy of Less Than$\pm \hbox{0.5}\, ^{\circ}{\hbox{C}}$(3$\sigma$) From$-\hbox{40}\, ^{\circ}\hbox{C}$to 105$\, ^{\circ}\hbox{C}$. IEEE J. Solid State Circuits 41(12): 2992-2997 (2006) - [j1]Martijn F. Snoeij, Albert J. P. Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
A CMOS Imager With Column-Level ADC Using Dynamic Column Fixed-Pattern Noise Reduction. IEEE J. Solid State Circuits 41(12): 3007-3015 (2006) - [c4]Kofi A. A. Makinwa, Martijn F. Snoeij:
A CMOS Temperature-to-Frequency Converter with an Inaccuracy of 0.5°C (3 σ) from -40 to 105°C. ISSCC 2006: 1141-1150 - [c3]Martijn F. Snoeij, Albert Theuwissen, Kofi A. A. Makinwa, Johan H. Huijsing:
A CMOS Imager with Column-Level ADC Using Dynamic Column FPN Reduction. ISSCC 2006: 2014-2023 - 2005
- [c2]Martijn F. Snoeij, Albert J. P. Theuwissen, Johan H. Huijsing:
A 1.8 V 3.2µW comparator for use in a CMOS imager column-level single-slope ADC. ISCAS (6) 2005: 6162-6165 - 2001
- [c1]Martijn F. Snoeij, Ovidiu Bajdechi, Johan H. Huijsing:
A 4th-order switched-capacitor sigma-delta A/D converter using a high-ripple Chebyshev loop filter. ISCAS (1) 2001: 615-618
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