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R. Redhammer

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2009
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T. Izák, Marian Vojs, Marián Veselý, Jaroslava Skriniarová, I. Novotný, Miroslav Michalka, R. Redhammer:
Electrical property dependence on thickness and morphology of nanocrystalline diamond thin films. Microelectron. J. 40(3): 615-617 (2009)

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