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W. Anwand

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2000 – 2009

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2009
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C. Y. Zhu, C. C. Ling, G. Brauer, W. Anwand, W. Skorupa:
Deep-level defects study of arsenic-implanted ZnO single crystal. Microelectron. J. 40(2): 286-288 (2009)

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