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ORCIDSanghoon Lee 0008
Person information
- affiliation: Texas A&M University, College Station, TX, USA
Other persons with the same name
- Sanghoon Lee (aka: Sang-Hoon Lee, Sang Hoon Lee) — disambiguation page
- Sanghoon Lee 0001
![[0000-0001-9895-5347]](https://dblp.uni-trier.de./img/orcid-mark.12x12.png "0000-0001-9895-5347")
— Yonsei University, Department of Electrical and Electronic Engineering, Multi-Dimensional Insight Laboratory, Seoul, South Korea (and 2 more) - Sanghoon Lee 0002 — Hanyang University
- Sanghoon Lee 0003 — Yonsei University, Department of Electrical and Electronic Engineering, Biometrics Engineering Research Center, Seoul, South Korea
- Sanghoon Lee 0004 — Kyungwon University
- Sanghoon Lee 0005 (aka: Sang-Hoon Lee 0005) — Yonsei University, Department of Electrical and Electronic Engineering, Seoul, South Korea
- Sanghoon Lee 0006 — North Carolina State University, Department of Electrical and Computer Engineering, Raleigh, NC, USA (and 1 more)
- Sanghoon Lee 0007 — Kennesaw State University, Marietta, GA, USA (and 3 more)
- Sanghoon Lee 0009 — SK Hynix, Icheon, South Korea
- Sanghoon Lee 0010 — Daegu Gyeongbuk Institute of Science and Technology, Daegu, South Korea (and 1 more)
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2020 – today
- 2021
[j4]Sanghoon Lee, Edgar Sánchez-Sinencio:
Current Reference Circuits: A Tutorial. IEEE Trans. Circuits Syst. II Express Briefs 68(3): 830-836 (2021)- 2020
- [j3]Sanghoon Lee, Stephen K. Heinrich-Barna, Kyoohyun Noh, Keith Kunz, Edgar Sánchez-Sinencio:
A 1-nA 4.5-nW 289-ppm/°C Current Reference Using Automatic Calibration. IEEE J. Solid State Circuits 55(9): 2498-2512 (2020)
2010 – 2019
- 2018
- [j2]Congyin Shi, Sanghoon Lee, Sergio Soto Aguilar, Edgar Sánchez-Sinencio:
A Time-Domain Digital-Intensive Built-In Tester for Analog Circuits. J. Electron. Test. 34(3): 313-320 (2018) - [j1]Sanghoon Lee, Congyin Shi, Jiafan Wang, Adriana C. Sanabria-Borbon, Hatem Osman, Jiang Hu, Edgar Sánchez-Sinencio:
A Built-In Self-Test and In Situ Analog Circuit Optimization Platform. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(10): 3445-3458 (2018)
Coauthor Index
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