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C. Gallon

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Journal Articles

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2011
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  - journals/mr/ArnaudPGRMB11
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  - https://dblp.org/rec/journals/mr/ArnaudPGRMB11
Franck Arnaud, L. Pinzelli, C. Gallon, M. Rafik, P. Mora, Frédéric Boeuf:
Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies. Microelectron. Reliab. 51(9-11): 1508-1514 (2011)

Conference and Workshop Papers

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2014
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  - conf/essderc/AndrieuCBPNRBPPSGMBGGCBRPSRJWAVFH14
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François Andrieu, Mikaël Cassé, E. Baylac, P. Perreau, O. Nier, Denis Rideau, R. Berthelon, Franck Pourchon, A. Pofelski, Barbara De Salvo, C. Gallon, Vincent Mazzocchi, D. Barge, C. Gaumer, O. Gourhant, A. Cros, Vincent Barral, Rossella Ranica, Nicolas Planes, Walter Schwarzenbach, E. Richard, Emmanuel Josse, Olivier Weber, Franck Arnaud, Maud Vinet, Olivier Faynot, Michel Haond:
Strain and layout management in dual channel (sSOI substrate, SiGe channel) planar FDSOI MOSFETs. ESSDERC 2014: 106-109

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