"Challenges and opportunity in performance, variability and reliability in ..."

Franck Arnaud et al. (2011)

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DOI: 10.1016/J.MICROREL.2011.06.059

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type: Journal Article

metadata version: 2020-02-22

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Franck Arnaud, L. Pinzelli, C. Gallon, M. Rafik, P. Mora, Frédéric Boeuf:
Challenges and opportunity in performance, variability and reliability in sub-45 nm CMOS technologies. Microelectron. Reliab. 51(9-11): 1508-1514 (2011)

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