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John Suehle

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2011
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  - https://dblp.org/rec/conf/esscirc/RyanWCSCOWS11
Jason T. Ryan, Lan Wei, Jason P. Campbell, Ricki G. Southwick, Kin P. Cheung, Anthony S. Oates, H.-S. Philip Wong, John Suehle:
Circuit-aware device reliability criteria methodology. ESSCIRC 2011: 255-258

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