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Jeffrey A. Mittereder

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2002
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  - journals/tr/MitterederRAI02
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Jeffrey A. Mittereder, Jason A. Roussos, Wallace T. Anderson, Dimitrios E. Ioannou:
Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction. IEEE Trans. Reliab. 51(4): 482-485 (2002)
2001
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Wallace T. Anderson, Jason A. Roussos, Jeffrey A. Mittereder, Dimitrios E. Ioannou, C. Moglestue:
Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectron. Reliab. 41(8): 1109-1113 (2001)

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