"Quantitative measurement of channel temperature of GaAs devices for ..."

Jeffrey A. Mittereder et al. (2002)

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DOI: 10.1109/TR.2002.804487

access: closed

type: Journal Article

metadata version: 2020-07-09

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Jeffrey A. Mittereder, Jason A. Roussos, Wallace T. Anderson, Dimitrios E. Ioannou:
Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction. IEEE Trans. Reliab. 51(4): 482-485 (2002)

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