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B. Beydoun

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Journal Articles

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2010
[j3]
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  - journals/mr/AlaeddineKDB10
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  - https://dblp.org/rec/journals/mr/AlaeddineKDB10
A. Alaeddine, M. Kadi, K. Daoud, B. Beydoun:
Characteristics degradation of the SiGe HBT under electromagnetic field stress. Microelectron. Reliab. 50(12): 1961-1966 (2010)
2007
[j2]
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M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter:
Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectron. J. 38(6-7): 727-734 (2007)
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M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter:
Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. Microelectron. Reliab. 47(9-11): 1406-1410 (2007)

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