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"Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT ..."

M. Alwan et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.096

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter:
Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. Microelectron. Reliab. 47(9-11): 1406-1410 (2007)

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