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Shahid Makhdoom

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2024
[j1]
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Shahid Makhdoom, Na Ren, Ce Wang, Chaobiao Lin, Yiding Wu, Kuang Sheng:
Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kV SiC MOSFETs Across Multiple Vendors and Generations. IEEE Access 12: 191442-191460 (2024)

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