"Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kV SiC ..."

Shahid Makhdoom et al. (2024)

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DOI: 10.1109/ACCESS.2024.3502161

access: open

type: Journal Article

metadata version: 2025-01-08

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Shahid Makhdoom, Na Ren, Ce Wang, Chaobiao Lin, Yiding Wu, Kuang Sheng:
Comprehensive Short Circuit Behavior and Failure Analysis of 1.2kV SiC MOSFETs Across Multiple Vendors and Generations. IEEE Access 12: 191442-191460 (2024)

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