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Kamil Raczkowski

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2024
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Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor P. Gotszalk:
Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors 24(17): 5649 (2024)

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