"Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems ..."

Andrzej Sikora et al. (2024)

> Home

Details and statistics

DOI: 10.3390/S24175649

access: open

type: Journal Article

metadata version: 2024-10-03

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/SikoraGBPPRG24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/SikoraGBPPRG24
Andrzej Sikora, Krzysztof Gajewski, Dominik Badura, Bartosz Pruchnik, Tomasz Piasecki, Kamil Raczkowski, Teodor P. Gotszalk:
Conductive Atomic Force Microscopy - Ultralow-Current Measurement Systems for Nanoscale Imaging of a Surface's Electrical Properties. Sensors 24(17): 5649 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.