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Paul Breuil

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Journal Articles

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2024
[j1]
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  - journals/et/GoudetSBTNDR24
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  - https://dblp.org/rec/journals/et/GoudetSBTNDR24
Esther Goudet, Fabio Sureau, Paul Breuil, Luis Peña Treviño, Lirida A. B. Naviner, Jean-Marc Daveau, Philippe Roche:
Analysis of Combinational Circuit Failure Rate based on Graph Partitioning and Probabilistic Binomial Approach. J. Electron. Test. 40(3): 291-313 (2024)

Conference and Workshop Papers

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2024
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  - conf/memocode/ZuccalaBDRM24
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Damiano Zuccalà, Paul Breuil, Jean-Marc Daveau, Philippe Roche, Katell Morin-Allory:
Formal Fault Injection in Digital Blocks with Mined Assertions. MEMOCODE 2024: 77-86

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