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H. Giebel

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1980 – 1989

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1986
[c2]
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  dblp key:
  - conf/dagm/SteurerGA86
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Johannes Steurer, H. Giebel, W. Altner:
Ein lichtmikroskopisches Verfahren zur zweieinhalbdimensionalen Auswertung von Oberflächen. DAGM-Symposium 1986: 66-70
1981
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Friedrich M. Wahl, Ludwig Abele, H. Giebel:
Texturanalyseverfahren zur Fehlermessung bei Glasbehältern. DAGM-Symposium 1981: 303-309

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