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Truong Duc Khai

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Conference and Workshop Papers

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2022
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Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, Truong Duc Khai, Chung Quan Tin, Loh Ing Hoe:
Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern. RIVF 2022: 226-231

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