"Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local ..."

Ushik Shrestha Khwakhali et al. (2022)

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DOI: 10.1109/RIVF55975.2022.10013920

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, Truong Duc Khai, Chung Quan Tin, Loh Ing Hoe:
Fabric Defect Detection Using Gray Level Co-occurence Matrix and Local Binary Pattern. RIVF 2022: 226-231

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