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Duo-Yao Kang

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2022
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Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee:
Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks. ITC 2022: 82-91
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Duo-Yao Kang, Shiou-Ning Lin, Kuen-Jong Lee:
Diagnosing Transition Delay Faults under Scan-Based Logic Array. ITC-Asia 2022: 13-18

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