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Min-Hui Chuang

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Journal Articles

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2023
[j1]
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  - journals/cee/ButolaLKAC23
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  - https://dblp.org/rec/journals/cee/ButolaLKAC23
Rajat Butola, Yiming Li, Sekhar Reddy Kola, Chandni Akbar, Min-Hui Chuang:
Application of long short-term memory modeling technique to predict process variation effects of stacked gate-all-around Si nanosheet complementary-field effect transistors. Comput. Electr. Eng. 105: 108554 (2023)

Conference and Workshop Papers

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2023
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Sekhar Reddy Kola, Yiming Li, Min-Hui Chuang:
Intrinsic Parameter Fluctuation and Process Variation Effect of Vertically Stacked Silicon Nanosheet Complementary Field-Effect Transistors. ISQED 2023: 1-8
2022
[c1]
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  - conf/isqed/KolaLCC22
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Sekhar Reddy Kola, Yiming Li, Chieh-Yang Chen, Min-Hui Chuang:
A Unified Statistical Analysis of Comprehensive Fluctuations of Gate-All-Around Silicon Nanosheet MOSFETs Induced by RDF, ITF, and WKF Simultaneously. ISQED 2022: 1-6

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