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Conference and Workshop Papers
- 2024
[c8]Randy Wolf, Vibhor Jain, Sameer Jain, Shafi Syed, Chi Zhang, Abdellatif Bellaouar, Arul Balasubramaniyan, Sujata Ghosh, Rebouh Benelbar, Liyou Lu:
SiGe and CMOS Technologies for Wireless PA Applications. BCICTS 2024: 298-305- [c7]P. Srinivasan, Oscar H. Gonzalez, Oscar D. Restrepo, J. Lestage, Shafi Syed, W. Taylor, Anirban Bandyopadhyay, Martin Gall, S. Ludvik:
Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers. IRPS 2024: 1-6 - 2023
- [c6]Mingcheng Chang, Zaid Al-Husseini, Shafi Syed, Wafa Arfaoui, Tianbing Chen, Andreas Knorr:
22FDX® Device Optimization for mmW PA. ESSDERC 2023: 105-108 - [c5]P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik:
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS 2023: 1-6 - 2022
- [c4]Alvin J. Joseph, Vibhor Jain, John J. Pekarik, Ajay Raman, Shafi Syed, Liu Hang, Ned Cahoon, Randy Wolf, Venkat Vanukuru, Elan Veeramani, Beng Woon Lim, Uppili S. Raghunathan, Qizhi Liu, Yves Ngu:
SiGe HBTs for Power Amplifiers in Front-End of Radio Communication Systems. BCICTS 2022: 1-6 - [c3]Germain Bossu, Shafi Syed, S. Evseev, Joris Angelo Sundaram Jerome, Wafa Arfaoui, D. Lipp, Mahesh Siddabathula:
22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability. IRPS 2022: 4 - 2021
- [c2]Zhixing Zhao, Steffen Lehmann, Wei Lun Oo, Amit Kumar Sahoo, Shafi Syed, Quang Huy Le, Dang Khoa Huynh, Talha Chohan, Dirk Utess, Dominik Kleimaier, Maciej Wiatr, Sabine Kolodinski, Jerome Mazurier, Jan Hoentschel, Andreas Knorr, Ned Cahoon, Stefan Kneitz:
22FDSOI device towards RF and mmWave applications. BCICTS 2021: 1-6 - [c1]P. Srinivasan
, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall:
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS 2021: 1-6
Coauthor Index
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