"RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier ..."

P. Srinivasan et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118043

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik:
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS 2023: 1-6

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