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Shang-Ze Chen

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2020 – today

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2020
[c1]
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De-Cheng Zhang, Ching-Chuan Chou, Ho-Hsiang Chen, Shang-Ze Chen, Jian-Ming Chen, Hui-Yun Bor, Wen-How Lan, Mu-Chun Wang:
Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments. ICKII 2020: 1-3

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