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X. Blasco

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Journal Articles

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2005
[j4]
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  - journals/mr/BlascoNAPV05
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X. Blasco, Montserrat Nafría, Xavier Aymerich, J. Pétry, Wilfried Vandervorst:
Breakdown spots of ultra-thin (EOT<1.5nm) HfO₂/SiO₂ stacks observed with enhanced - CAFM. Microelectron. Reliab. 45(5-6): 811-814 (2005)
2002
[j3]
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X. Blasco, Montserrat Nafría, Xavier Aymerich:
Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO₂ Gate Oxide on MOS Structures. Microelectron. Reliab. 42(9-11): 1513-1516 (2002)
2001
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Marc Porti, X. Blasco, Montserrat Nafría, Xavier Aymerich, Alexander Olbrich, Bernd Ebersberger:
Local current fluctuations before and after breakdown of thin SiO₂ films observed with conductive atomic force microscope. Microelectron. Reliab. 41(7): 1041-1044 (2001)
[j1]
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Daniel Hill, X. Blasco, Marc Porti, Montserrat Nafría, Xavier Aymerich:
Characterising the surface roughness of AFM grown SiO₂ on Si. Microelectron. Reliab. 41(7): 1077-1079 (2001)

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