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"Local current fluctuations before and after breakdown of thin ..."

Marc Porti et al. (2001)

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DOI: 10.1016/S0026-2714(01)00066-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Marc Porti, X. Blasco, Montserrat Nafría, Xavier Aymerich, Alexander Olbrich, Bernd Ebersberger:
Local current fluctuations before and after breakdown of thin SiO₂ films observed with conductive atomic force microscope. Microelectron. Reliab. 41(7): 1041-1044 (2001)

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