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Atsushi Yoshikawa 0003

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affiliation: Renesas Technology Corporation, Tokyo, Japan
affiliation (2000 - 2003): Mitsubishi Electric Corporation, Japan
affiliation (1996 - 2000): Microelectronics Research Laboratories, NEC Corporation, Kanagawa, Japan

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Journal Articles

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2008
[j2]
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  - journals/tvlsi/TakeuchiYKKMKYS08
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Kan Takeuchi, Atsushi Yoshikawa, Michio Komoda, Ken Kotani, Hiroaki Matsushita, Yusaku Katsuki, YuyoYamamoto, Takao Sato:
Clock-Skew Test Module for Exploring Reliable Clock-Distribution Under Process and Global Voltage-Temperature Variations. IEEE Trans. Very Large Scale Integr. Syst. 16(11): 1559-1566 (2008)
1997
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Atsushi Yoshikawa, Seiji Kajihara, Masahiro Numa, Kozo Kinoshita:
A diagnosis method for single logic design errors in gate-level combinational circuits. Syst. Comput. Jpn. 28(6): 30-39 (1997)

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