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Conference and Workshop Papers
- 2024
[c10]Jeevesh Kumar, Aadil Bashir Dar, Asif A. Shah, K. M. Amogh, Sumana Chattaraj, Utpreksh Patbhaje, Anand Kumar Rai, Rupali Verma, Mayank Shrivastava:
Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders. IRPS 2024: 1-5- [c9]Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Aadil Bashir Dar, Mayank Shrivastava:
Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs. IRPS 2024: 1-7 - [c8]Rupali Verma, Utpreksh Patbhaje, Asif Altaf Shah, Jeevesh Kumar, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Mayank Shrivastava:
Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs. IRPS 2024: 74 - 2023
- [c7]Jeevesh Kumar, Hemanjaneyulu Kuruva, Harsha B. Variar, Utpreksh Patbhaje, Mayank Shrivastava:
Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices. IRPS 2023: 1-6 - [c6]Utpreksh Patbhaje
, Rupali Verma, Jeevesh Kumar, Ansh, Mayank Shrivastava:
Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs. IRPS 2023: 1-6 - [c5]Rupali Verma, Utpreksh Patbhaje, Jeevesh Kumar, Anand Kumar Rai, Mayank Shrivastava:
OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State. IRPS 2023: 1-5 - 2022
- [c4]Jeevesh Kumar, Mayank Shrivastava:
Are Argon and Nitrogen Gases Really Inert to Graphene Devices? DRC 2022: 1-2 - 2020
- [c3]Jeevesh Kumar, Ansh, Hemanjaneyulu Kuruva, Mayank Shrivastava:
Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight. DRC 2020: 1-2 - [c2]Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava:
First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel. IRPS 2020: 1-4 - [c1]Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava:
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress. IRPS 2020: 1-4
Coauthor Index
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