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Wilmar M. Heuvelman

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Journal Articles

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2012
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  - journals/tcad/AlpaslanKMHD12
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  - https://dblp.org/rec/journals/tcad/AlpaslanKMHD12
Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak:
NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 31(5): 809-813 (2012)

Conference and Workshop Papers

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2010
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Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel:
NIM- a noise index model to estimate delay discrepancies between silicon and simulation. DATE 2010: 1373-1376

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