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Pierre-Louis Charvet

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2013
[j2]
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Pierre-Louis Charvet, Pierre Nicolas, D. Bloch, B. Savornin:
MEMS packaging reliability assessment: Residual Gas Analysis of gaseous species trapped inside MEMS cavities. Microelectron. Reliab. 53(9-11): 1622-1627 (2013)
2012
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Alexis Peschot, Christophe Poulain, Frédéric Souchon, Pierre-Louis Charvet, Nelly Bonifaci, Olivier Lesaint:
Contact degradation due to material transfer in MEM switches. Microelectron. Reliab. 52(9-10): 2261-2266 (2012)

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