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John Valcore

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2010 – 2019

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2019
[i1]
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  - electronic edition @ arxiv.org (open access)
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  - journals/corr/abs-1910-10067
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  - https://dblp.org/rec/journals/corr/abs-1910-10067
Jack Kenney, John Valcore, Scott Riggs, Edward A. Rietman:
Deep Learning Regression of VLSI Plasma Etch Metrology. CoRR abs/1910.10067 (2019)

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