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M. Alwan

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Journal Articles

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2007
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M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter:
Bias temperature instability from gate charge characteristics investigations in N-Channel Power MOSFET. Microelectron. J. 38(6-7): 727-734 (2007)
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M. Alwan, B. Beydoun, K. Ketata, M. Zoaeter:
Gate charge behaviors in N-channel power VDMOSFETs during HEF and PBT stresses. Microelectron. Reliab. 47(9-11): 1406-1410 (2007)

Conference and Workshop Papers

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1999
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H. Zreak, M. Alwan, M. Khaddour:
A Fuzzy Approach to Map Building. IEA/AIE 1999: 33-42

Coauthor Index

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