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Yi-Zhe Guo

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2018
[j1]
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Chang-Fu Han, Yi-Zhe Guo, Chung-Jen Chung, Chang-Hong Shen, Jen-Fin Lin:
Effects of SiO₂ film thickness and operating temperature on thermally-induced failures in through-silicon-via structures. Microelectron. Reliab. 83: 1-13 (2018)

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