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Y. Descas

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2017
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Abdellatif Bey-Temsamani, S. Kauffmann, Y. Descas, Bart Vandevelde, Franco Zanon, Geert Willems:
Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. Microelectron. Reliab. 76-77: 42-46 (2017)

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