"Improved and accurate physics-of-failure (PoF) methodology for ..."

Abdellatif Bey-Temsamani et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.06.047

access: closed

type: Journal Article

metadata version: 2020-02-22

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Abdellatif Bey-Temsamani, S. Kauffmann, Y. Descas, Bart Vandevelde, Franco Zanon, Geert Willems:
Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems. Microelectron. Reliab. 76-77: 42-46 (2017)

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