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Darshit Vaghani

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2010 – 2019

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2018
[c8]
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Satyadev Ahlawat, Darshit Vaghani, Naveen Bazard, Virendra Singh:
Using MISR as Countermeasure Against Scan-Based Side-Channel Attacks. EWDTS 2018: 1-6
[c7]
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Darshit Vaghani, Satyadev Ahlawat, Jaynarayan T. Tudu, Masahiro Fujita, Virendra Singh:
On Securing Scan Design Through Test Vector Encryption. ISCAS 2018: 1-5
2017
[c6]
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Satyadev Ahlawat, Darshit Vaghani, Jaynarayan T. Tudu, Virendra Singh:
On Securing Scan Design from Scan-Based Side-Channel Attacks. ATS 2017: 58-63
[c5]
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Satyadev Ahlawat, Darshit Vaghani, Virendra Singh:
Preventing scan-based side-channel attacks through key masking. DFT 2017: 1-4
[c4]
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Satyadev Ahlawat, Darshit Vaghani, Virendra Singh:
An efficient test technique to prevent scan-based side-channel attacks. ETS 2017: 1-2
[c3]
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Satyadev Ahlawat, Darshit Vaghani, Rohini Gulve, Virendra Singh:
A low cost technique for scan chain diagnosis. ISCAS 2017: 1-4
[c2]
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Satyadev Ahlawat, Darshit Vaghani, Jaynarayan T. Tudu, Ashok Suhag:
A Cost Effective Technique for Diagnosis of Scan Chain Faults. VDAT 2017: 191-204
2016
[c1]
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Satyadev Ahlawat, Darshit Vaghani, Rohini Gulve, Virendra Singh:
Enabling LOS delay test with slow scan enable. EWDTS 2016: 1-4

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