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Min-Ju Ahn

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Journal Articles

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2016
[j2]
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Sang Min Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Device instability of amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 575-579 (2016)
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Jong Hoon Lee, Seul Ki Yu, Jae Won Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 580-584 (2016)

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