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"Negative bias illumination stress instability in amorphous InGaZnO thin ..."
Jong Hoon Lee et al. (2016)
- Jong Hoon Lee, Seul Ki Yu, Jae Won Kim, Min-Ju Ahn, Won-Ju Cho, Jong Tae Park:
Negative bias illumination stress instability in amorphous InGaZnO thin film transistors with transparent source and drain. Microelectron. Reliab. 64: 580-584 (2016)
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