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Mathias Klenner

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2016
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Mathias Klenner, Christian Zech, Axel Hülsmann, Jutta Kuhn, Michael Schlechtweg, Oliver Ambacher:
Spectroscopic Measurement of Material Properties Using an Improved Millimeter-Wave Ellipsometer Based on Metallic Substrates. IEEE Trans. Instrum. Meas. 65(11): 2551-2559 (2016)

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