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ORCIDKlinsmann J. Coelho Silva Meneses
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- affiliation: Simon Fraser University, Burnaby, BC, Canada
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Conference and Workshop Papers
- 2023
[c10]Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Linda Wu, Israel Koren, Zahava Koren:
Image Degradation in Time Due to Interacting Hot Pixels. DFT 2023: 1-6- 2022
- [c9]Glenn H. Chapman, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Image Degradation due to Interacting Adjacent Hot Pixels. DFT 2022: 1-6 - 2021
- [c8]Glenn H. Chapman, Simone Neufeld, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Dependence of SEUs in Digital Cameras on Pixel size and Elevation. DFT 2021: 1-4 - 2020
- [c7]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, Israel Koren, Zahava Koren:
Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation. DFT 2020: 1-4 - 2019
- [c6]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Bifei Huang, Hao Yang, Israel Koren, Zahava Koren:
Detecting SEUs in Noisy Digital Imagers with small pixels. DFT 2019: 1-6 - [c5]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Image degradation from hot pixel defects with pixel size shrinkage. IMSE 2019: 1-7 - 2018
- [c4]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Israel Koren, Zahava Koren:
Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels. DFT 2018: 1-6 - [c3]Glenn H. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Parham Purbakht, Israel Koren, Zahava Koren:
Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels. IMSE 2018: 1-6 - 2016
- [c2]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren:
Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes. IMSE 2016: 1-6 - 2015
- [c1]Glenn H. Chapman, Rahul Thomas, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Tommy Q. Yang, Israel Koren, Zahava Koren:
Single Event Upsets and Hot Pixels in digital imagers. DFTS 2015: 41-46
Coauthor Index
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