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I. N. Kots

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2015
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O. A. Ageev, Alexey S. Kolomiytsev, A. V. Bykov, V. A. Smirnov, I. N. Kots:
Fabrication of advanced probes for atomic force microscopy using focused ion beam. Microelectron. Reliab. 55(9-10): 2131-2134 (2015)

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