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Ruiqiang Song
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2020 – today
- 2021
- [c3]Ruiqiang Song, Jiageng Shi, Jinjin Shao, Xiaoyu Zhang:
Machine Learning based SET Propagation Prediction for Large Scale Integrated Circuits. ASICON 2021: 1-4 - 2020
- [j7]Ruiqiang Song
, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology. IEICE Electron. Express 17(4): 20190708 (2020)
2010 – 2019
- 2019
- [j6]Ruiqiang Song
, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
Characterization of P-hit and N-hit single-event transient using heavy ion microbeam. IEICE Electron. Express 16(8): 20190141 (2019) - [j5]Jingyan Xu
, Yang Guo, Ruiqiang Song
, Bin Liang, Yaqing Chi:
Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs. Symmetry 11(6): 793 (2019) - [c2]Ruiqiang Song, Jinjin Shao, Bin Liang, Yaqing Chi, Jianjun Chen:
A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area. ASICON 2019: 1-4 - [c1]Xiaoyu Zhang, Bin Liang, Ruiqiang Song
:
Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient. ASICON 2019: 1-4 - 2017
- [j4]Bin Liang, Ruiqiang Song
, Jianwei Han, Yaqing Chi, Rui Chen, Chunmei Hu, Jianjun Chen, Yingqi Ma, Shipeng Shangguan
:
Comparison of single-event upset generated by heavy ion and pulsed laser. Sci. China Inf. Sci. 60(7): 072401:1-072401:9 (2017) - [j3]Ruiqiang Song
, Shuming Chen, Bin Liang, Yaqing Chi, Jianjun Chen:
Modeling the impact of process and operation variations on the soft error rate of digital circuits. Sci. China Inf. Sci. 60(12): 129402 (2017) - 2015
- [j2]Ruiqiang Song
, Shuming Chen, Yibai He, Yankang Du:
Flip-flops soft error rate evaluation approach considering internal single-event transient. Sci. China Inf. Sci. 58(6): 1-12 (2015) - [j1]Jingyan Xu, Shuming Chen, Pengcheng Huang, Peipei Hao, Ruiqiang Song
, Chunmei Hu:
Single event transient propagation in dynamic complementary metal oxide semiconductor cascade circuits. IEICE Electron. Express 12(23): 20150849 (2015)
Coauthor Index
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