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Sanjay K. Banerjee

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Journal Articles

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2005
[j2]
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  dblp key:
  - journals/mr/KellyDOB05
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  - https://dblp.org/rec/journals/mr/KellyDOB05
David Q. Kelly, Sagnik Dey, David Onsongo, Sanjay K. Banerjee:
Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectron. Reliab. 45(7-8): 1033-1040 (2005)
1990
[j1]
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  - journals/tcad/YericTB90
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Gregory Munson Yeric, A. F. Tasch Jr., Sanjay K. Banerjee:
A universal MOSFET mobility degradation model for circuit simulation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 9(10): 1123-1126 (1990)

Conference and Workshop Papers

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2018
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  - conf/drc/RaiPZKWVLFXCKB18
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Amritesh Rai, Jun Hong Park, Chenxi Zhang, Iljo Kwak, Steven Wolf, Suresh Vishwanath, Xinyu Lin, Jacek Furdyna, Huili Grace Xing, Kyeongjae Cho, Andrew C. Kummel, Sanjay K. Banerjee:
Enhanced P-Type Behavior in 2D WSe2 via Chemical Defect Engineering. DRC 2018: 1-2

Coauthor Index

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