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"Considerations for evaluating hot-electron reliability of strained Si ..."
David Q. Kelly et al. (2005)
- David Q. Kelly, Sagnik Dey, David Onsongo, Sanjay K. Banerjee:
Considerations for evaluating hot-electron reliability of strained Si n-channel MOSFETs. Microelectron. Reliab. 45(7-8): 1033-1040 (2005)
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