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Wee Loon Ng

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2014
[j1]
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Wee Loon Ng, Kheng Chok Tee, Junfeng Liu, Yong Chiang Ee, Oliver Aubel, Chuan Seng Tan, Kin Leong Pey:
Robust Electromigration reliability through engineering optimization. Microelectron. Reliab. 54(9-10): 1666-1670 (2014)

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