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S. Schömann

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2004
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Thomas Schweinböck, S. Schömann, D. Álvarez, Marco Buzzo, Werner Frammelsberger, Peter Breitschopf, Günther Benstetter:
New trends in the application of Scanning Probe Techniques in Failure Analysis. Microelectron. Reliab. 44(9-11): 1541-1546 (2004)

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