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M. Gros-Jean

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Journal Articles

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2013
[j3]
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  dblp key:
  - journals/mr/FoissacBKDGB13
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  - https://dblp.org/rec/journals/mr/FoissacBKDGB13
R. Foissac, S. Blonkowski, M. Kogelschatz, P. Delcroix, M. Gros-Jean, F. Bassani:
Impact of bilayer character on High K gate stack dielectrics breakdown obtained by conductive atomic force microscopy. Microelectron. Reliab. 53(12): 1857-1862 (2013)
2007
[j2]
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  - journals/mr/PinzelliGBVBG07
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L. Pinzelli, M. Gros-Jean, Y. Bréchet, F. Volpi, A. Bajolet, J.-C. Giraudin:
High-K dielectric deposition in 3D architectures: The case of Ta₂O₅ deposited with metal-organic precursor TBTDET. Microelectron. Reliab. 47(4-5): 700-703 (2007)
2001
[j1]
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  - journals/mr/BorsoniBGKLRVRW01
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G. Borsoni, N. Béchu, M. Gros-Jean, Michael L. Korwin-Pawlowski, R. Laffitte, V. Le Roux, L. Vallier, Névine Rochat, C. Wyon:
Ultra-thin oxides on silicon fabricated using ultra-slow multicharged ion beams. Microelectron. Reliab. 41(7): 1063-1066 (2001)

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