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Julien Goxe

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affiliation: Freescale Semiconducteurs France, Toulouse, France

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Journal Articles

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2015
[j4]
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  - journals/mr/CastignollesGM15
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M. Castignolles, Julien Goxe, R. Martin:
Failure analysis on recovering low resistive via in mixed-mode device. Microelectron. Reliab. 55(9-10): 1574-1578 (2015)
[j3]
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Julien Goxe, C. Abouda, Béatrice Vanhuffel:
Latent gate oxide defects case studies. Microelectron. Reliab. 55(9-10): 1607-1610 (2015)
2013
[j2]
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Corinne Bergès, Julien Goxe:
Benefits of field failure distribution modeling to the failure analysis. Microelectron. Reliab. 53(9-11): 1194-1198 (2013)
[j1]
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Yann Weber, Julien Goxe, M. Castignolles:
Detectability of automotive power MOSFET on-resistance failure at high current induced by Wafer Fab process excursion. Microelectron. Reliab. 53(9-11): 1393-1398 (2013)

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